โค้ด: เลือกทั้งหมด
smartctl 6.5 2016-01-24 r4214 [x86_64-linux-4.15.0-137-generic] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org
=== START OF INFORMATION SECTION ===
Device Model: TOSHIBA KSG60ZMV256G M.2 2280 256GB
Serial Number: 682F70F8F5WP
LU WWN Device Id: 5 00080d 8001d8626
Firmware Version: ABDA4102
User Capacity: 256,060,514,304 bytes [256 GB]
Sector Sizes: 512 bytes logical, 4096 bytes physical
Rotation Rate: Solid State Device
Form Factor: M.2
Device is: Not in smartctl database [for details use: -P showall]
ATA Version is: Unknown(0x0ff8) (minor revision not indicated)
SATA Version is: SATA >3.2 (0x1ff), 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is: Fri Jan 21 19:54:24 2022 +07
SMART support is: Available - device has SMART capability.
SMART support is: Enabled
=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED
General SMART Values:
Offline data collection status: (0x00) Offline data collection activity
was never started.
Auto Offline Data Collection: Disabled.
Self-test execution status: ( 16) The self-test routine was aborted by
the host.
Total time to complete Offline
data collection: ( 120) seconds.
Offline data collection
capabilities: (0x5b) SMART execute Offline immediate.
Auto Offline data collection on/off support.
Suspend Offline collection upon new
command.
Offline surface scan supported.
Self-test supported.
No Conveyance Self-test supported.
Selective Self-test supported.
SMART capabilities: (0x0003) Saves SMART data before entering
power-saving mode.
Supports SMART auto save timer.
Error logging capability: (0x01) Error logging supported.
General Purpose Logging supported.
Short self-test routine
recommended polling time: ( 2) minutes.
Extended self-test routine
recommended polling time: ( 11) minutes.
SCT capabilities: (0x003d) SCT Status supported.
SCT Error Recovery Control supported.
SCT Feature Control supported.
SCT Data Table supported.
SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE
5 Reallocated_Sector_Ct 0x0033 100 100 010 Pre-fail Always - 0
9 Power_On_Hours 0x0032 100 100 000 Old_age Always - 7172
12 Power_Cycle_Count 0x0033 100 100 000 Pre-fail Always - 1567
166 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 0
167 Unknown_Attribute 0x0022 100 100 000 Old_age Always - 0
168 Unknown_Attribute 0x0012 100 100 000 Old_age Always - 0
173 Unknown_Attribute 0x0012 188 188 000 Old_age Always - 0
175 Program_Fail_Count_Chip 0x0033 100 100 010 Pre-fail Always - 0
176 Erase_Fail_Count_Chip 0x0033 100 100 010 Pre-fail Always - 0
177 Wear_Leveling_Count 0x0033 088 088 010 Pre-fail Always - 0
178 Used_Rsvd_Blk_Cnt_Chip 0x0033 100 100 010 Pre-fail Always - 0
179 Used_Rsvd_Blk_Cnt_Tot 0x0033 100 100 010 Pre-fail Always - 0
180 Unused_Rsvd_Blk_Cnt_Tot 0x0033 100 100 010 Pre-fail Always - 100
181 Program_Fail_Cnt_Total 0x0033 100 100 010 Pre-fail Always - 100
182 Erase_Fail_Count_Total 0x0033 100 100 010 Pre-fail Always - 100
187 Reported_Uncorrect 0x0033 100 100 000 Pre-fail Always - 3
192 Power-Off_Retract_Count 0x0012 100 100 000 Old_age Always - 118
194 Temperature_Celsius 0x0022 044 023 000 Old_age Always - 56 (Min/Max 23/77)
195 Hardware_ECC_Recovered 0x002b 100 100 000 Pre-fail Always - 0
199 UDMA_CRC_Error_Count 0x0012 100 100 000 Old_age Always - 0
238 Unknown_Attribute 0x0032 088 088 010 Old_age Always - 0
241 Total_LBAs_Written 0x0013 100 100 000 Pre-fail Always - 382071
242 Total_LBAs_Read 0x0013 100 100 000 Pre-fail Always - 318880
SMART Error Log Version: 1
ATA Error Count: 3
CR = Command Register [HEX]
FR = Features Register [HEX]
SC = Sector Count Register [HEX]
SN = Sector Number Register [HEX]
CL = Cylinder Low Register [HEX]
CH = Cylinder High Register [HEX]
DH = Device/Head Register [HEX]
DC = Device Command Register [HEX]
ER = Error register [HEX]
ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.
Error 3 occurred at disk power-on lifetime: 2380 hours (99 days + 4 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 08 2a 47 58 40 Error: UNC at LBA = 0x0058472a = 5785386
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 08 70 30 32 f4 40 08 00:24:44.774 READ FPDMA QUEUED
60 08 68 30 32 de 40 08 00:24:44.774 READ FPDMA QUEUED
60 08 60 18 8c 44 40 08 00:24:44.774 READ FPDMA QUEUED
60 08 58 00 95 ec 40 08 00:24:44.774 READ FPDMA QUEUED
60 78 50 f8 f9 74 40 08 00:24:44.772 READ FPDMA QUEUED
Error 2 occurred at disk power-on lifetime: 2380 hours (99 days + 4 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 d8 2a 47 58 40 Error: WP at LBA = 0x0058472a = 5785386
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
61 18 e8 d8 2b dc 40 08 00:24:13.798 WRITE FPDMA QUEUED
60 08 e0 b0 62 ea 40 08 00:24:13.798 READ FPDMA QUEUED
60 08 d8 28 47 58 40 08 00:24:13.798 READ FPDMA QUEUED
60 08 d0 f0 aa f2 40 08 00:24:13.798 READ FPDMA QUEUED
60 08 c8 80 5a d4 40 08 00:24:13.798 READ FPDMA QUEUED
Error 1 occurred at disk power-on lifetime: 2380 hours (99 days + 4 hours)
When the command that caused the error occurred, the device was active or idle.
After command completion occurred, registers were:
ER ST SC SN CL CH DH
-- -- -- -- -- -- --
40 51 48 2a 47 58 40 Error: UNC at LBA = 0x0058472a = 5785386
Commands leading to the command that caused the error were:
CR FR SC SN CL CH DH DC Powered_Up_Time Command/Feature_Name
-- -- -- -- -- -- -- -- ---------------- --------------------
60 08 48 28 47 58 40 08 00:23:42.449 READ FPDMA QUEUED
60 08 40 60 5a 52 40 08 00:23:42.449 READ FPDMA QUEUED
60 08 38 60 a8 f2 40 08 00:23:42.449 READ FPDMA QUEUED
60 08 30 28 55 9c 40 08 00:23:42.449 READ FPDMA QUEUED
60 08 28 10 59 52 40 08 00:23:42.449 READ FPDMA QUEUED
SMART Self-test log structure revision number 1
Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error
# 1 Short offline Aborted by host 00% 4433 -
# 2 Short offline Aborted by host 00% 3121 -
# 3 Short offline Aborted by host 00% 3121 -
# 4 Short offline Completed without error 00% 2 -
# 5 Short offline Completed without error 00% 0 -
SMART Selective self-test log data structure revision number 1
SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS
1 0 0 Not_testing
2 0 0 Not_testing
3 0 0 Not_testing
4 0 0 Not_testing
5 0 0 Not_testing
Selective self-test flags (0x0):
After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.