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Re: ขอวิธีเช็ควันหมดอายุของ ssd บน ubantu

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smartctl 6.5 2016-01-24 r4214 [x86_64-linux-4.15.0-137-generic] (local build)
Copyright (C) 2002-16, Bruce Allen, Christian Franke, www.smartmontools.org

=== START OF INFORMATION SECTION ===
Device Model:     TOSHIBA KSG60ZMV256G M.2 2280 256GB
Serial Number:    682F70F8F5WP
LU WWN Device Id: 5 00080d 8001d8626
Firmware Version: ABDA4102
User Capacity:    256,060,514,304 bytes [256 GB]
Sector Sizes:     512 bytes logical, 4096 bytes physical
Rotation Rate:    Solid State Device
Form Factor:      M.2
Device is:        Not in smartctl database [for details use: -P showall]
ATA Version is:   Unknown(0x0ff8) (minor revision not indicated)
SATA Version is:  SATA >3.2 (0x1ff), 6.0 Gb/s (current: 6.0 Gb/s)
Local Time is:    Fri Jan 21 19:54:24 2022 +07
SMART support is: Available - device has SMART capability.
SMART support is: Enabled

=== START OF READ SMART DATA SECTION ===
SMART overall-health self-assessment test result: PASSED

General SMART Values:
Offline data collection status:  (0x00)	Offline data collection activity
					was never started.
					Auto Offline Data Collection: Disabled.
Self-test execution status:      (  16)	The self-test routine was aborted by
					the host.
Total time to complete Offline 
data collection: 		(  120) seconds.
Offline data collection
capabilities: 			 (0x5b) SMART execute Offline immediate.
					Auto Offline data collection on/off support.
					Suspend Offline collection upon new
					command.
					Offline surface scan supported.
					Self-test supported.
					No Conveyance Self-test supported.
					Selective Self-test supported.
SMART capabilities:            (0x0003)	Saves SMART data before entering
					power-saving mode.
					Supports SMART auto save timer.
Error logging capability:        (0x01)	Error logging supported.
					General Purpose Logging supported.
Short self-test routine 
recommended polling time: 	 (   2) minutes.
Extended self-test routine
recommended polling time: 	 (  11) minutes.
SCT capabilities: 	       (0x003d)	SCT Status supported.
					SCT Error Recovery Control supported.
					SCT Feature Control supported.
					SCT Data Table supported.

SMART Attributes Data Structure revision number: 16
Vendor Specific SMART Attributes with Thresholds:
ID# ATTRIBUTE_NAME          FLAG     VALUE WORST THRESH TYPE      UPDATED  WHEN_FAILED RAW_VALUE
  5 Reallocated_Sector_Ct   0x0033   100   100   010    Pre-fail  Always       -       0
  9 Power_On_Hours          0x0032   100   100   000    Old_age   Always       -       7172
 12 Power_Cycle_Count       0x0033   100   100   000    Pre-fail  Always       -       1567
166 Unknown_Attribute       0x0012   100   100   000    Old_age   Always       -       0
167 Unknown_Attribute       0x0022   100   100   000    Old_age   Always       -       0
168 Unknown_Attribute       0x0012   100   100   000    Old_age   Always       -       0
173 Unknown_Attribute       0x0012   188   188   000    Old_age   Always       -       0
175 Program_Fail_Count_Chip 0x0033   100   100   010    Pre-fail  Always       -       0
176 Erase_Fail_Count_Chip   0x0033   100   100   010    Pre-fail  Always       -       0
177 Wear_Leveling_Count     0x0033   088   088   010    Pre-fail  Always       -       0
178 Used_Rsvd_Blk_Cnt_Chip  0x0033   100   100   010    Pre-fail  Always       -       0
179 Used_Rsvd_Blk_Cnt_Tot   0x0033   100   100   010    Pre-fail  Always       -       0
180 Unused_Rsvd_Blk_Cnt_Tot 0x0033   100   100   010    Pre-fail  Always       -       100
181 Program_Fail_Cnt_Total  0x0033   100   100   010    Pre-fail  Always       -       100
182 Erase_Fail_Count_Total  0x0033   100   100   010    Pre-fail  Always       -       100
187 Reported_Uncorrect      0x0033   100   100   000    Pre-fail  Always       -       3
192 Power-Off_Retract_Count 0x0012   100   100   000    Old_age   Always       -       118
194 Temperature_Celsius     0x0022   044   023   000    Old_age   Always       -       56 (Min/Max 23/77)
195 Hardware_ECC_Recovered  0x002b   100   100   000    Pre-fail  Always       -       0
199 UDMA_CRC_Error_Count    0x0012   100   100   000    Old_age   Always       -       0
238 Unknown_Attribute       0x0032   088   088   010    Old_age   Always       -       0
241 Total_LBAs_Written      0x0013   100   100   000    Pre-fail  Always       -       382071
242 Total_LBAs_Read         0x0013   100   100   000    Pre-fail  Always       -       318880

SMART Error Log Version: 1
ATA Error Count: 3
	CR = Command Register [HEX]
	FR = Features Register [HEX]
	SC = Sector Count Register [HEX]
	SN = Sector Number Register [HEX]
	CL = Cylinder Low Register [HEX]
	CH = Cylinder High Register [HEX]
	DH = Device/Head Register [HEX]
	DC = Device Command Register [HEX]
	ER = Error register [HEX]
	ST = Status register [HEX]
Powered_Up_Time is measured from power on, and printed as
DDd+hh:mm:SS.sss where DD=days, hh=hours, mm=minutes,
SS=sec, and sss=millisec. It "wraps" after 49.710 days.

Error 3 occurred at disk power-on lifetime: 2380 hours (99 days + 4 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 08 2a 47 58 40  Error: UNC at LBA = 0x0058472a = 5785386

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  60 08 70 30 32 f4 40 08      00:24:44.774  READ FPDMA QUEUED
  60 08 68 30 32 de 40 08      00:24:44.774  READ FPDMA QUEUED
  60 08 60 18 8c 44 40 08      00:24:44.774  READ FPDMA QUEUED
  60 08 58 00 95 ec 40 08      00:24:44.774  READ FPDMA QUEUED
  60 78 50 f8 f9 74 40 08      00:24:44.772  READ FPDMA QUEUED

Error 2 occurred at disk power-on lifetime: 2380 hours (99 days + 4 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 d8 2a 47 58 40  Error: WP at LBA = 0x0058472a = 5785386

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  61 18 e8 d8 2b dc 40 08      00:24:13.798  WRITE FPDMA QUEUED
  60 08 e0 b0 62 ea 40 08      00:24:13.798  READ FPDMA QUEUED
  60 08 d8 28 47 58 40 08      00:24:13.798  READ FPDMA QUEUED
  60 08 d0 f0 aa f2 40 08      00:24:13.798  READ FPDMA QUEUED
  60 08 c8 80 5a d4 40 08      00:24:13.798  READ FPDMA QUEUED

Error 1 occurred at disk power-on lifetime: 2380 hours (99 days + 4 hours)
  When the command that caused the error occurred, the device was active or idle.

  After command completion occurred, registers were:
  ER ST SC SN CL CH DH
  -- -- -- -- -- -- --
  40 51 48 2a 47 58 40  Error: UNC at LBA = 0x0058472a = 5785386

  Commands leading to the command that caused the error were:
  CR FR SC SN CL CH DH DC   Powered_Up_Time  Command/Feature_Name
  -- -- -- -- -- -- -- --  ----------------  --------------------
  60 08 48 28 47 58 40 08      00:23:42.449  READ FPDMA QUEUED
  60 08 40 60 5a 52 40 08      00:23:42.449  READ FPDMA QUEUED
  60 08 38 60 a8 f2 40 08      00:23:42.449  READ FPDMA QUEUED
  60 08 30 28 55 9c 40 08      00:23:42.449  READ FPDMA QUEUED
  60 08 28 10 59 52 40 08      00:23:42.449  READ FPDMA QUEUED

SMART Self-test log structure revision number 1
Num  Test_Description    Status                  Remaining  LifeTime(hours)  LBA_of_first_error
# 1  Short offline       Aborted by host               00%      4433         -
# 2  Short offline       Aborted by host               00%      3121         -
# 3  Short offline       Aborted by host               00%      3121         -
# 4  Short offline       Completed without error       00%         2         -
# 5  Short offline       Completed without error       00%         0         -

SMART Selective self-test log data structure revision number 1
 SPAN  MIN_LBA  MAX_LBA  CURRENT_TEST_STATUS
    1        0        0  Not_testing
    2        0        0  Not_testing
    3        0        0  Not_testing
    4        0        0  Not_testing
    5        0        0  Not_testing
Selective self-test flags (0x0):
  After scanning selected spans, do NOT read-scan remainder of disk.
If Selective self-test is pending on power-up, resume after 0 minute delay.
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